Enhance decoding of pre-movement EEG patterns for brain-computer interfaces
The Characteristics and Locking Process of Nonlinear MEMS Gyroscopes
Evaluation of polarization field in InGaN/GaN multiple quantum well struc...
Growth Control of High-Performance InAs/GaSb Type-II Superlattices via Op...
High-Performance Germanium Waveguide Photodetectors on Silicon*
Nanoscale thermal transport across an GaAs/AlGaAs heterostructure interface
Investigation of modulation transfer function in InGaAs photodetector sma...
Seed-mediated growth of heterostructured Cu1.94S-MS (M = Zn, Cd, Mn) and ...
High-performance phosphorene electromechanical actuators
Recent Advances of Two-Dimensional Nanomaterials for Electrochemical Capa...

A discussion on mass resolution in secondary ion mass spectrometry



Author(s): Li, ZP (Li, Zhanping); Zhao, LX (Zhao, Lixia); Xiong, B (Xiong, Bing); Fan, RL (Fan, Runlong); Liu, DY (Liu, Dunyi); Cha, LZ (Cha, Liangzhen)

Source: SURFACE AND INTERFACE ANALYSIS DOI: 10.1002/sia.6725 Early Access Date: NOV 2019

Abstract: Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF-SIMS and the conventionally high-performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long-term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.

Accession Number: WOS:000496183100001

ISSN: 0142-2421

eISSN: 1096-9918

Full Text: https://onlinelibrary.wiley.com/doi/full/10.1002/sia.6725


北京市海淀區清華東路甲35號 北京912信箱 (100083)




[email protected]

版權所有 中國科學院半導體研究所

備案號:京ICP備05085259號 京公網安備110402500052 中國科學院半導體所聲明

在藏区为藏民照相赚钱吗 卖程序麻将机构成什么罪 麻将血流成河换三张技巧 牛股微信群大全 上海天天彩选4详情 广东好彩一开奖走势图 大盘指数图怎么看 六肖公式出特规律 福建22选5开奖走势图大星 王者归来捕鱼游戏 姚记棋牌9165